An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science (Iop Concise Physics) (Hardcover)

An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science (Iop Concise Physics) By Sarah Fearn Cover Image
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Description


This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.


Product Details
ISBN: 9781643279107
ISBN-10: 1643279106
Publisher: Iop Concise Physics
Publication Date: October 16th, 2015
Pages: 66
Language: English
Series: Iop Concise Physics